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 Smart Integrated Electronic Systems

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Interconnect Fault tolerance Integrated circuits Education Machine-learning algorithms Circuit Electrothermal analysis Computer architecture Circuits Evaluation Calibration Alternate testing Indirect testing Power supplies Magnetic tunneling Bioimpedance CMOS Integrated circuit modeling Specifications Automatic test pattern generation Test efficiency Low power Transistors Bandwidth Noise Convective accelerometer Analog signals Side-channel analysis Accelerometer Analog/IF signals Analytical models SEU RF test Integrated circuit reliability Integrated circuit interconnections Built-In-Self-Test Three-dimensional integrated circuits Test cost reduction Carbon nanotube CNT Logic gates Integrated circuit testing Reliability Monitoring Competencies Low-cost measurements Advanced PMA STT-MRAM Digital ATE Alternate test Integrated circuit design Three-dimensional displays Analog and RF integrated circuits COTS Power demand Design RSA Time-domain analysis Correlation MEMS Noise measurement Carbon nanotube interconnects Test confidence Delays Test 3D Copper Process variability ATE programming Phase noise 3D integration ZigBee Clocks SRAM Carbon nanotube Temperature distribution Capacitors Secure IC Interconnects BIST Microprocessors Integrated circuit noise Switches One bit acquisition Through-silicon vias Bioimpedance spectroscopy Analog/RF integrated circuits FDSOI technology Brainstorming 1-bit acquisition OQPSK Circuit faults Biosensor Digital signal processing Ensemble methods CMOS memory circuits Thermal sensor Sensors Carbon nanotubes RF integrated circuits Indirect test Phase shifter